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SurfaceSpectra Ltd, founded by Professors John Vickerman and David Briggs with Dr Alex Henderson, is dedicated to the supply of high quality scientific information products that embrace and support the exploitation of surface analysis and its complex instrumentation.

With an extensive global customer base of both leading blue-chip companies from diverse industries and reputable academics in the field of surface analysis, SurfaceSpectra is pleased to announce its latest product range as part of its ongoing quest to provide unique and comprehensive knowledge systems for surface analysis.

** Second edition now available **

We are pleased to announce the release of the second edition of ToF-SIMS: Materials Analysis by Mass Spectrometry.

ToF-SIMS-cover

ToF-SIMS: Materials Analysis by Mass Spectrometry

Edited by John C. Vickerman and David Briggs

The only book wholly dedicated to time-of-flight SIMS.

Available as a hardbacked, printed book or electronic datafiles, downloadable chapter-by-chapter from the internet.

27 chapters covering the fundamentals, interpretation and applications of ToF-SIMS.

Chapters written by recognised experts in their discipline.

 

The Static SIMS Library

version 4

Edited by
John C. Vickerman, David Briggs and Alex Henderson

The most comprehensive collection of Static SIMS data currently available.

Expert spectral interpretation and a Peak Search Tool to help you find solutions to your problems!

Now expanded to over 1000 materials.

Click here for
Demonstration version

Static SIMS Library

 

Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy

Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy

Edited by David Briggs and John T. Grant

[ISBN 1-901019-04-7]

Published in association with IM Publications

If “Briggs and Seah” has been your guide in the past, you will want this book.

 

SurfaceSpectra Identity

* FREE *

Written by Alex Henderson

Free software that allows you to view and export isotope patterns.

Identity logo

 

XPS of Polymers Database

The XPS Database of Polymers

Edited by Graham Beamson and David Briggs

The CD version of ‘High Resolution XPS of Organic Polymers – The Scienta ESCA300 Database‘ by the same editors.

Wide scan survey, narrow scan and valence band spectra from 111 pure polymers.

Data fully curve-fitted.

Raw data available on CD in VAMAS/MultiPak/ASCII formats.

See also: