The ToF book contains 27 chapters by internationally regarded experts. These can be purchased individually on-line or as a hardcover book.
The chapters are as follows;
Prologue: ToF-SIMS—An evolving mass spectrometry of materials
John C. Vickerman
The history of Static SIMS—A personal perspective
Alfred Benninghoven
Status of cascade theory
Herbert M. Urbassek
Fundamentals of organic SIMS: insights from experiments and models
Arnaud Delcorte
Molecular speciation analysis of inorganic compounds
Luc Van Vaeck
Molecular dynamics simulations, the theoretical partner to dynamic cluster SIMS experiments
Barbara J. Garrison and Zbigniew Postawa
Cationisation
Birgit Hagenhoff
Laser post-ionisation—fundamentals
Andreas Wucher
Time-of-flight mass analysers
Bruno W. Schueler
Analysis beams used in ToF-SIMS
Roland Hill
Cluster and polyatomic primary ion beams
John S. Fletcher and Christopher Szakal
Molecular depth profiling
Alex Shard and Ian Gilmore
Role of operating conditions in ToF-SIMS
Ian Gilmore
Laser post-ionisation for elemental and molecular surface analysis
Nicholas P. Lockyer
Sample handling for ToF-SIMS
Fraser Reich
Qualitative interpretation of spectra
David Briggs and Ian W. Fletcher
Multivariate analysis of SIMS spectra
Alex Henderson
ToF-SIMS image analysis
Bonnie J. Tyler
Characterisation of polymeric materials
Lu-Tao Weng and Chi-Ming Chan
Functional modification of surfaces using self-assembled monlayers
Amy V. Walker
Application of SIMS to study of biological systems
Alan M Piwowar and Nicholas Winograd
Medical and biological applications of cluster beam-ToF-SIMS
David Touboul, Olivier Laprévote and Alain Brunelle
Depth profiling of inorganic materials
Ewald Niehuis and Thomas Grehl
Depth profiling in organic electronics
Ewald Niehuis
Contamination monitoring and failure analysis
Arwa Ginwalla, Thomas F. Fister and Ian A. Mowat
Photographic and digital graphic materials
Luc Van Vaeck, Yannick Vercammen, Jens Lenaerts, Roel De Mondt, Jaymes Van Luppen and Frank Vangaever
Applications of ToF-SIMS in cosmochemistry
Thomas Stephan and Ian C. Lyon
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