ToF-SIMS:
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In the decade following the first edition of this book, ToF-SIMS has been transformed by the adoption of heavy polyatomic or cluster primary ion sources. Lower damage rates and higher yields of analytically useful secondary ions have benefited all areas of application, especially in medical science, but the ability to perform depth profiling of organics has opened up entirely new possibilities. These and other advances in instrumentation and data handling/interpretation are all reflected in this completely revised edition.
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is the most versatile of the surface analysis techniques that have been developed during the last 40 years. Current instrumentation provides a powerful combination of capabilities for molecular detection and trace element determination, imaging and microanalysis, and shallow depth profiling.
Contributors who are acknowledged experts in ToF-SIMS, both in its instrumental and theoretical development and in its application, provide a comprehensive treatment. An integrated view of the technique is presented, in addition each chapter stands alone as an authoritative description of its particular area of expertise.
The book will be invaluable
- to those in education or in industry who require an overview of the technique;
- for those who wish to understand its application in particular areas of materials technology.
The book is introduced by two chapters, one, which reviews the history and development of static SIMS and another, which introduces the basic theory.
These are followed by 27 chapters split into five sections;
- ToFSIMS Instrumentation
- The Fundamentals of Ion Formation (experiment and theory)
- Experimental Methods for Optimising the ToFSIMS Experiment
- Spectral Data Interpretation
- Analytical Applications
Further details:
See also:
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